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authorPaul Walker <paul.walker@arm.com>2021-12-09 18:30:22 +0000
committerPaul Walker <paul.walker@arm.com>2021-12-17 13:13:36 +0000
commit22370530a37f55e41c19ab8021ada59745111240 (patch)
tree9fe1d1a2a74337ee9f097e983e590a4634fd67c8 /lldb/source/Plugins/ScriptInterpreter/Python/ScriptInterpreterPython.cpp
parent3f3b5c3ec0da8f4982a8645fdb403de582295f0b (diff)
[NFC][SVE] Add missing tests for i32 INC/DEC patterns.
D111441 included trunc isel patterns for sve_int_pred_pattern_a but no accompanying tests. This patch adds the missing tests and also simplifies the isel patterns that use sve_cnt_shl_imm. Differential Revision: https://reviews.llvm.org/D115512
Diffstat (limited to 'lldb/source/Plugins/ScriptInterpreter/Python/ScriptInterpreterPython.cpp')
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